易泛特技术(深圳)有限公司

深圳,  广东 
China
http://www.effecttek.com
  • Booth: T2311

易泛特技术(深圳)有限公司成立于2016年,有多名资深行业专家领衔,致力于为行业客户提供业界领先的高分辩率、非接触式3D测量系统;

Effecttek 3D测量系统采用白光和红光等纳米级分辩率的光学器件,配合高精度X/Y/Z移动平台和强大的3D软件算法处理,帮助用户解决精密测量难题,包括:线宽膜厚测量、高度差测量、平面度测量、共面度测量、粗糙度测量等,对透明材质的多层测量也得心应手;

产品广泛应用于微电子、半导体、5G、3D玻璃、新型医疗、精密工业制造等领域,提供从产品研发、设计到加工验收的高精度测量支持。

深圳)有限公司成立于2016年,有多名资深行业专家领衔,致力于为行业客户提供业界领先的高分辩率、非接触式3D测量系统;

Effecttek 3D测量系统采用白光和红光等纳米级分辩率的光学器件,配合高精度X/Y/Z移动平台和强大的3D软件算法处理,帮助用户解决精密测量难题,包括:线宽膜厚测量、高度差测量、平面度测量、共面度测量、粗糙度测量等,对透明材质的多层测量也得心应手;

产品广泛应用于微电子、半导体、5G、3D玻璃、新型医疗、精密工业制造等领域,提供从产品研发、设计到加工验收的高精度测量支持。


 Products

  • Film thickness measuring instrument E-80
    1. Non-contact optical measurement system 2. Corresponding to various materials, linearity ±0.5μm 3. High-speed sampling, the fastest cycle is 20μs 4. Powerful CPK statistics function 5. Measure contour, fault, groove depth, height, etc....

  • 1. Adopting white light confocal technology, the resolution reaches the nanometer level, and the optical fiber sensor is adopted, which has the advantages of anti-interference, low loss, safe isolation, and high reliability.
    2. The mechanical precision reaches the micron level, the operation is stable, the runout is small, and the wear is low
    3. Y-direction automatic measurement, repeat accuracy 1μm
  • Film thickness measuring instrument EA-160
    1. The maximum range of 160mm×160mm is automatically measured 2. Repeated measurement accuracy ≤0.5μm 3. Suitable for high reflective and high light transmission materials 4. Measure film thickness, line width, flatness, etc....

  • 1. Using white light confocal technology, the resolution reaches 5nm and the maximum range is 13mm
    2. The motion accuracy of 0-160mm reaches the micron level, there is no mechanical contact in the X and Y directions, and the fully closed loop feedback system is adopted to achieve high-precision measurement
    3. High-precision, high-resolution CCD system, combined with effecttetk software algorithm, supports image positioning auxiliary system
  • Film thickness measuring instrument ES-200
    1. Non-contact 3D surface scanning system 2. Equipped with X, Y, Z high-precision motion platform 3. Automatic measurement within 200mm×200mm 4. 2D profile view and 3D point cloud 5. Friendly man-machine interface 6. Measure surface roughness...

  • 1. Using white light interference technology, the resolution reaches nanometer level, and the maximum field of view is 100mm
    2. 0-200mm motion accuracy reaches micron level, stable operation, small runout and low wear
  • Semicondutor /LED/LCD; Second hand equipment
    Main porducts includs: Optics, Lamp, Chuck Clean Wafer, E-chuck, Focks Ring, PR & Chemicals, Laser head, Ceramics, Quartz, Clean Bottle, Filter,Valve, X-Ray; Used Machine Refurb & Tech Support ESC New & Over haul ...

  • ·Hg Lamp
    ·UV Lamp
    ·Xenon Lamp
    ·Halogen Lamp
    ·Heater Lamp
    ·Sunlight Lamp
    ·Flash Lamp
    ·LED lamp
    ·Others